Diffuse Reflectance Optics, Hardware and Sampling
Session Chair: Dr. Mui Saranwong, National Food Research Institute, Japan
Summary: Diffuse reflectance instrumentation and sampling hardware has changed much in the past few years- expanding from the old "FT vs. dispersive instrument" paradigm to a much more diverse array of options that a user could easily “get lost” in. This session will highlight several of today's hardware and sampling technologies.
08.30-09.10 Aspects of NIR Process Integration - Volker J. Frost,* Jurgen Stevens and Christoph Luhr (Buchi Labortechnik AG, Switzerland)
09.10-09.50 Noise Evaluation of NIR Instrument - Tsutomu Okura,* Kunio Sashida and Shanji Park (Soma Optics, Japan)
09.50-10.30 Building Computer Free Sorting Devices based on Reflection of Visible and NIR Wavelengths - Ron Haff (USDA-ARS-WRRC) and Tom Pearson (USDA-ARS-GMPRC, USA)
10.30-11.00 Break
11.00-11.40 Micro-optics for NIR Imaging and Spectroscopy - Marion O'Farrell (SINTEF, Norway)
11.40-12.20 Trace-Analysis with NIR Imaging; Case in Point: Explosive Detection -
Lam K Nguyen (OPOTEK), Gregory L. Klunder (LLNL) and Eli Margalith (OPOTEK)